Small-Scale Mechanics: NANOLAB
Instrumented Indentation
The platform can probe the mechanical response of small material surfaces in the sub micron regime. It contains a nano- and a micro-.pendulum that can do normal indentation and scratch tests in air, liquid or high temperature environments (up to 500°C).
The platform can probe the mechanical response of small material surfaces in the sub micron regime. It contains a nano- and a micro-.pendulum that can do normal indentation and scratch tests in air, liquid or high temperature environments (up to 500°C).
Scanning Probe Microscope/Atomic Force Microscopy
The SPM/AFM is equipped with the following modules:
The SPM/AFM is equipped with the following modules:
- Contact Mode: Topography, Lateral Force Imaging, Contact Error Mode, Force Modulation Microscopy, Spreading Resistance Imaging, Piezoresponse Force Modulation
- Semi-Contact Mode: Topography, Phase Imaging Mode, Semi-Contact Error Mode
- Many-Pass Techniques: Magnetic Force Microscopy, Kelvin Probe Microscopy, Electric Force Microscopy, Scanning Capacitance Microscopy, Lithography (Force and local anodic oxidation)
- Controlled Environments: Air, Liquid, Heating (up to 300°C) and Cooling (down to -30°C)
- Hybrid Mode: By using an advanced controller, we have the abilities for real time signal processing and data analysis, for quantitative nanomechanical measurements
Sample Preparation/Processing
The laboratory is equipped with the following sample preparation and processing equipment:
The laboratory is equipped with the following sample preparation and processing equipment:
- Oven (up to 500°C)
- Ultrasonic Cleaner
- Mechanical Polisher
- Optical Microscope